Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...

The GI-307 High-Speed Inspection System from General Inspection, LLC (Gi) combines 360 degree dimensional metrology with 360 ...

Whether the discussion is about smart manufacturing or digital transformation, one of the biggest conversations in the semiconductor industry today centers on the tremendous amount of data fabs ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Within the context of semiconductor inspection and failure analysis, latent defects present a significant challenge because they make it difficult to determine whether a fault originated during ...

A recent spike in battery-related fires has highlighted the difficulty of spotting flaws in their production. Rarely visible to the naked eye, these flaws can lead to serious battery malfunctions. The ...

TrackEi enables real-time defect detection and predictive maintenance using NVIDIA Jetson edge AI. Credit: APChanel/Shutterstock. L&T Technology Services (LTTS) has announced the launch of TrackEi, an ...