Functional printed-circuit-board (PCB) test has had a seesaw relationship with other board-test techniques. When surface-mount parts and ball-grid arrays first appeared, limited circuit-node access ...

SE: Why is applying functional test content so challenging today? Ruiz: There are a couple of different factors that make successfully applying functional patterns on the tester a challenge. In fact, ...

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This article is a condensed version of an article that appeared in the November/December 2022 issue of Chip Scale Review. Adapted with permission. Read the original ...

The evolutionary path of semiconductor ATE (automated test equipment) seemed clear at Semicon West, held July 13–15 in San Francisco. Gone are the expensive, big-iron functional testers of yesterday, ...