For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...

Boundary Scan: What Is It? Boundary scan test techniques were first discussed in the late 1980s. At the time, experts believed that the growing complexity of chips would have a serious effect on an ...

Boundry-scan testing (IEEE1149.1/JTAG) is a novel procedure for some test engineers and technicians. But ScanWorks Interconnect Development Station version 3.4 from Asset Intertech should ease their ...